Multipurpose Multi-axis X-ray Diffractometer (2)

◆Equipment overview

This equipment is installed in the first experimental hatch in the upper course of BL46XU. It is a general-purpose, multi-axis X-ray diffractometer, which uses X-ray diffraction to evaluate inorganic and organic film, metals, ceramics, composite materials and more. It is mainly used for industrial and industrial-academic collaboration users.

◆Features of the Equipment

Diffractometer
This diffractometer is a 6-axis diffractometer manufactured by HUBER, which consists of 4 axes around the sample（φ,χ,ω,ωz） and 3 detector axes（2θ,2θz, 2θ2）. As well, xs,ys,zs,rxs,rys axes can be attached around the sample and tha,ttha axes for mounting analyzer crystals can be installed on the detector axis.
Movement of each axis【Link １】

Detector
Depending on the purpose of the experiment, any of the following detectors can be chosen. Both the 0-dimensional detector and the 2-dimensional detector PILATUS 300K can be installed on the detector axis.
・0-Dimensional Detector: NaI scintillation detector (Photon application)
　　　　　　　 LaBr3 scintillation detector (FMB oxford)
・1-Dimensional Detector: 6-Fold MYTHEN(dectris)
・2-Dimensional Detector: PILATUS 100K, 300K, 2M　(dectris)
Detailed information on the detector can be found in the equipment accessories section below.

Control Software
SPEC (Certified Scientific Software）is used to control the beamline and the diffractometer.


X-ray Energy
The standard SPring-8 undulator and standard 2 crystal spectrometer (Si (111) plane) is used. The available X-ray energy ranges from 4.5～37.5 keV for primary light.
As for high-energy X-rays, X-rays with 60-80 keV are available by using 3rd-order emitted light (mixed with 1st- and 4th-order light).

Beam Size
The beam size changes depending on the measurement objectives.
The maximum beam size is approximately 1.0 mm wide by 0.7 mm high.
The minimum beam slit size: approximately 30 um×30 um
The minimum beam size by Fresnel Zone Plate: Approximately 3 um×10 um

Beam Intensity
12.4 keV, with a beam size length of 30 um and width 400 um (slit configuration) of approximately 5.0 × 10¹¹　photons/sec

Other
・A multi-axis diffractometer with almost the same specifications as this multi-axis diffractometer is installed in the second hatch of the BL19B2, which shares equipment accessories and control environments. Depending on the purpose of the experiment, you can select an inserted light source (BL46XU) and a bending electromagnet light source (BL19B2).
・There is a free space 【Link 2】 on the downstream side of the multi-axis diffractometer. The size is 2.0 m (in the optical axis direction) by 2.5 m (in the optical axis orthogonal direction) by 2.0 m (height). Experiments can be carried out using user provided equipment or diffraction experiments can be conducted without multi-axis instruments, and multi-axis diffractometers.

◆Equipment accessories

Automated stage for sample alignment (installed on the multi-axis diffractometer phi-axis)
　zs-axis, xs-axis, ys-axis, rxs-axis, rys-axis
　The zs-axis is mounted on the multi-axis diffractometer phi-axis, and various automated stages are installed on the zs axis according to the experiment. Click here for more details 【Link ３】.

Sample Environment
　・Sample Heating Equipment【Link ４】(Reflection configuration): Anton Paar DHS1100 (Room Temperature to 1100℃）
　・Sample Cooling and Heating Equipment 【Link ５】(Reflection configuration): Anton Paar DCS500 (-180℃ to 500℃)
　・Tension Test Machine【Link ６】: Maximum tension load 2KN, same length 3cm x width 1cm x thickness 0.5 mm.

Detector
　・0-Dimensional Detector: NaI scintillation detector (Photon application) 【Link 7】
　　　　　　 　　 LaBr3 scintillation detector (FMB oxford) 【Link 8】
　・1-Dimensional Detector: 6-fold MYTHEN (dectris) 【Link 9】
　・2-Dimenstional Detector: PILATUS 100K (dectris)
　　　 PILATUS 300K (dectris) 【Link 10】
PILATUS 2M (dectris) 【Link 11】

Detector axis optical systems (when using a 0-dimensional detector)
　・Double slit 【Link 12】
　・Solar Slit
　・Analyzer Crystal 【Link 13】

Concentration Elements
　・Zone Plate
　・Refractive Lens

◆Experiment / sample preparation

This equipment is a versatile, multipurpose X-ray diffractometer with sample and experiment preparation different for each experiment. If the assignment is selected, the beamline representative will contact you.

◆Experimental procedure / precautions

This equipment is a versatile, multipurpose X-ray diffractometer, with experimental procedures and precautions different for each user experiment. Therefore, we do not prepare common manuals but for each user experiment, users and beamline personnel will often work together to create experimental procedures.

◆Contact

小金澤　智之（このメールアドレスはスパムボットから保護されています。閲覧するにはJavaScriptを有効にする必要があります。）
佐藤　真直（msato@ spring8.or.jp）

◆List of representative treatises

"Efficient inverted polymer solar cells employing favourable molecular orientation"
V. Vohra, et al.
Nature Photonics, 9, (2015) 403-408
https://doi.org/10.1038/nphoton.2015.84

"Crystallization Dynamics of Organolead Halide Perovskite by Real-Time X-ray Diffraction"
T. Miyadera, et al.
Nano Lett., 15, (2015) 5630-5634
https://doi.org/10.1021/acs.nanolett.5b02402

"Fe-Ni composition dependence of magnetic anisotropy in artificially fabricated L1 0-ordered FeNi films"
T. Kojima, et al.
J. Phys.: Condens. Matter, 26, (2014) 064207_1-10
https://doi.org/10.1088/0953-8984/26/6/064207

"Ionic Conductivity in Ionic Liquid Nano Thin Films"
S. Maruyama, et al.
ACS Nano, 12, (2018) 10509-10517
https://doi.org/10.1021/acsnano.8b06386

"Elastic and Plastic Deformation Behavior Studied by In-Situ Synchrotron X-ray Diffraction in Nanocrystalline Nickel"
H. Adachi, et al.
Materials Transactions, 57, (2016) 1447-1453
https://doi.org/10.2320/matertrans.MH201505