Multipurpose Multi-Axis X-Ray Diffractometer (1)

◆Equipment overview

The equipment is installed in the second experimental hatch in the upper course of BL19B2. It is a general-purpose, multi-axis X-ray diffractometer, which uses X-ray diffraction to evaluate inorganic and organic film, metals, ceramics, composite materials and more. It is mainly used for industrial and industrial-academic collaboration users.

◆Features of the Equipment

Diffractometer
This diffractometer is a 6-axis diffractometer manufactured by HUBER, which consists of 4 axes around the sample（φ,χ,ω,ωz） and 2 detector axes（2θ,2θz）. As well, xs,ys,zs,rxs,rys axes can be attached around the sample and tha,ttha axes for mounting analyzer crystals can be installed on the detector axis.

Detector
Depending on the purpose of the experiment, any of the following detectors can be chosen. Both the 0-dimensional detector and the 2-dimensional detector PILATUS 300K can be installed on the detector axis.
・0-Dimensional Detector: NaI scintillation detector (Photon application)
　　　　　　　 LaBr3 scintillation detector (FMB oxford)
・1-Dimensional Detector: 6-Fold MYTHEN(dectris)
・2-Dimensional Detector: PILATUS 100K, 300K　(dectris)
Detailed information on the detector can be found in the equipment accessories section below.

Control Software
SPEC (Certified Scientific Software）is used to control the beamline and the diffractometer.

X-ray Energy
The light source is a bending magnet light source using a standard 2 crystal spectrometer（Si（111）plane and Si（311）plane. The available X-ray energy ranges from 4.5～72 keV.

Beam Size
The beam size changes depending on the measurement objectives.
The maximum beam size is 10.0㎜ wide by 0.2㎜ high (while collecting vertically)
Minimum beam size slit: approximately 0.1mm x 0.1mm

Beam Intensity
12.4 keV, with a beam size length of 0.1mm and width 1.0mm (slit configuration) of approximately 5.0 × 10⁹　photons/sec

Other
・A multi-axis diffractometer with almost the same specifications as this multi-axis diffractometer is installed in the first hatch of the BL46XU, which shares equipment accessories and control environments. Depending on the purpose of the experiment, you can select an inserted light source (BL46XU) and bending electromagnet light source (BL19B2).

◆Equipment accessories

Automated stage for sample alignment (installed on the multi-axis diffractometer phi-axis)
　zs-axis, xs-axis, ys-axis, rxs-axis, rys-axis
The zs-axis is mounted on the multi-axis diffractometer phi-axis, and various automated stages are installed on the zs axis according to the experiment.

Sample Environment
　・Sample Heating Equipment (Reflection configuration): Anton Paar DHS1100 (Room Temperature to 1100℃）
　・Sample Cooling and Heating Equipment (Reflection configuration): Anton Paar DCS500 (-180℃ to 500℃)
　・Tension Test Machine: Maximum tension load 2KN, same length 2cm x width 1cm x thickness 0.5 mm.

Detector
　・0-Dimensional Detector: NaI scintillation detector (Photon application)
　　　　　　 　　 LaBr3 scintillation detector (FMB oxford)
　・1-Dimensional Detector: 6-fold MYTHEN (dectris)
　・2-Dimenstional Detector: PILATUS 100K (dectris)
　　　 PILATUS 300K (dectris)

Detector axis optical systems (when using a 0-dimensional detector)
・Double slit
・Solar Slit

◆Experiment / sample preparation

This equipment is a versatile, multipurpose X-ray diffractometer with sample and experiment preparation different for each experiment. If the assignment is selected, the beamline representative will contact you.

◆Experimental procedure / precautions

This equipment is a versatile, multipurpose X-ray diffractometer, with experimental procedures and precautions different for each user experiment. Therefore, we do not prepare common manuals but for each user experiment, users and beamline personnel will often work together to create experimental procedures.

◆Contact

小金澤　智之（このメールアドレスはスパムボットから保護されています。閲覧するにはJavaScriptを有効にする必要があります。）
佐藤　真直（msato@ spring8.or.jp）

◆List of representative treatises

"Band-bending induced passivation: high performance and stable perovskite solar cells using a perhydropoly(silazane) precursor"
H. Kanda, et al.
Energy & Environmental Science, 13, (2020) 1222-1230
https://doi.org/10.1039/C9EE02028D

"Naphthodithiophene-Naphthobisthiadiazole Copolymers for Solar Cells: Alkylation Drives the Polymer Backbone Flat and Promotes Efficiency"
I. Osaka, et al.
J. Am. Chem. Soc., 135, (2013) 8834-8837
https://doi.org/10.1021/ja404064m

"Terazulene Isomers: Polarity Change of OFETs through Molecular Orbital Distribution Contrast"
Y. Yamaguchi, et al.
J. Am. Chem. Soc., 138, (2016) 11335-11343
https://doi.org/10.1021/jacs.6b06877


"In situ Residual Stress Analysis in a Phenolic Resin and Copper Composite Material during Curing"
A. Izumi, et al.
Polymer, 182, (2019) 121857
https://doi.org/10.1016/j.polymer.2019.121857

"Evaluation of Dislocation Density for 1100 Aluminum with Different Grain Size during Tensile Deformation by Using In-Situ X-ray Diffraction Technique"
H. Adachi, et al.
Materials Transactions, 56, (2015) 671-678
https://doi.org/10.2320/matertrans.L-M2015803