BL37XU

◆Outline of beamline

BL37XU is a hard X-ray undulator beamline that is mainly used for studies of X-ray micro/nano-spectrochemical analysis such as XRF/XAFS imaging, wavelength-dispersive XAFS, depth-resolved XAFS, TXRF and XRF holography. This beamline has three experimental hutches and consists of standard undulator-beamline optics.

From 2011A, the nanobeam X-ray fluorescence spectrometer is available to users at BL37XU, enabling them to perform analyses using 100-nm-order X-ray beams. The spectrometer has been installed by the SR Nano-Beam Analysis Center for Green/Nano-technologies (participating institution: RIKEN), a satellite of the "Research Base Networks to Develop a Low-Carbon Society" project initiated with a second supplementary budget for fiscal 2009 as part of the Environmental Energy Technology Innovation Plan, which is stationed as a Stepping Stone for Growth Strategy.

◆Research field

・X-ray spectrochemical analysis using micro/nano beam
・Ultra trace element analysis
・High energy X-ray fluorescence analysis

◆Light source and optical system

The light source of BL37XU is an in-vacuum type undulator, whose period length is 32 mm and the number of period is 140. The energy range from 4.5 to 18.8 keV is covered by the fundamental radiation from the light source by tuning its gap from 8 to 50 mm. Figure 1 shows a schematic view of the beamline. A front-end in the storage ring tunnel and a transport channel in the optics hutch are composed of the standard components. Features of this beamline are to consist of three experimental hutches supplying focused X-ray beam from 100 nm to several hundred micron and to consist of a SPring-8 standard undulator-beamline optics. Details of the optics are shown in the following.

White undulator radiation is further monochromatized using a SPring-8 standard liquid nitrogen cooled double-crystal monochromator located at 43 m from the source. The monochromator covers a wide energy range by switching two set of crystal pair; from 4.5 to 37.7 keV by Si 111 ∼ Si 111 pair and from 12 to 113 keV by Si 333 ∼ Si 511 pair. The flux density of the monochromatic beam measured at 52 m from the source is more than 10¹³photons/s from 8 to 30 keV. Two horizontal deflecting mirrors are placed downstream of the monochromator in order to eliminate higher harmonics and to obtain focused X-ray beam in horizontal direction. The coatings are stripes of Pt and Rh, which are switched depending on the energy region of the measurement.

◆Contact

Please note that each e-mail address is followed by "@spring8.or.jp."

Kiyofumi NITTA
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-0833
Fax : +81-(0)791-58-0830
e-mail : nittak

Oki SEKIZAWA
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-0833
Fax : +81-(0)791-58-0830
e-mail : sekizawa

Hiroki SUGA
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-0833
Fax : +81-(0)791-58-0830
e-mail : hiroki-suga